Scanning Electron Microscopes
Scanning Electron Microscopes (SEMs) are powerful tools used in materials science and engineering to investigate the surface morphology and composition of materials at high magnification. SEMs use a focused beam of electrons to scan the surface of a sample, generating high-resolution images that reveal details at the nanoscale. The electrons interact with the atoms in the sample, producing signals that can be detected and used to create images with exceptional depth of field and resolution. SEMs are capable of producing images with magnifications ranging from 10x to over 1,000,000x, making them an essential tool for researchers and engineers working in fields such as metallurgy, nanotechnology, and semiconductor manufacturing.
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