Transmission Electron Microscopy
Transmission Electron Microscopy (TEM) is a technique that uses a beam of electrons to image the internal structure of a thin sample. In TEM, a high-energy electron beam is transmitted through a thin sample, and the resulting image is formed by the interaction of the electrons with the sample. TEM is capable of achieving resolutions of less than 0.1 nm, making it a powerful tool for studying the structure and properties of materials at the atomic scale. TEM is widely used in materials science, nanotechnology, and biology to study the microstructure of materials, including defects, grain boundaries, and interfaces. It is also used to study the structure of biological samples, such as viruses and cells, and to investigate the structure and properties of materials at high temperatures and under extreme conditions.
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