Scanning Electron Microscopy
Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses a focused beam of electrons to create high-resolution images of the surface of a sample. The electron beam scans the surface of the sample, and the electrons that are scattered or emitted from the sample are detected and used to create an image. SEM can provide detailed information about the topography, morphology, and composition of a sample, and is widely used in materials science, biology, and other fields. SEM can also be used to analyze the elemental composition of a sample using energy-dispersive X-ray spectroscopy (EDS), which detects the characteristic X-rays emitted by the sample when it is bombarded with electrons.
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